11 b 200 MS/s 28‐nm CMOS 2b/cycle successive‐approximation register analogue‐to‐digital converter using offset‐mismatch calibrated comparators
نویسندگان
چکیده
Abstract This letter presents an 11 b 200 MS/s 28 nm CMOS 2b/cycle successive‐approximation register (SAR) analogue‐to‐digital converter (ADC). The offset calibration technique is proposed to reduce the comparator mismatch that degrades linearity of high‐resolution SAR ADC. reduced within 0.25 least significant bit (LSB) by generating a compensation voltage from capacitor‐resistor (C‐R) hybrid digital‐to‐analogue converters (DACs). prototype ADC implemented in 28‐nm process demonstrates measured differential and integral non‐linearities 0.6 LSB 1.73 at resolution, respectively. signal‐to‐noise‐and‐distortion ratio (SNDR) spurious‐free dynamic range (SFDR) are 50.9 dB 66.2 Nyquist, occupies active die area 0.115 mm 2 consumes 3.98 mW 1.1‐V supply voltage.
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ژورنال
عنوان ژورنال: Electronics Letters
سال: 2023
ISSN: ['0013-5194', '1350-911X']
DOI: https://doi.org/10.1049/ell2.12929